HW tests: wear-leveling for storage #4417
Labels
code
Code improvements
core
Trezor Core firmware. Runs on Trezor Model T and T2B1.
hardware only
Issue which does not appear on the emulator - but on physical device only.
tests
Automated integration tests
In #4375 we only erase one sector of storage instead of all of them to gain a bit of speed. (This should not be a problem in practice because tests are never long enough to need the sector switching logic -- although it might be a good idea to test that too :) ).
Anyway, this saves some wear on the second sector of storage. To even out the load, we could also flip the active sector every time storage is reinitialized. See also #4375 (review)
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